Многофункциональный тестер транзисторов MK-328, обновленная версия, ручной тестер ёмкости и сопротивления

Описание

MK-328多功能晶体管测试仪 MK328升级版手持式 1. MK-168的升级换代产品--- MK-328 2. 128x64点阵液晶屏，显示内容更加丰富，图文并茂。优化的 显示字体和 内容，更加一目了然。 3.使用9V电池供电，带有电池仓，方便电池更换。 4.影响精度的相关电阻采用千分之一薄膜电阻，其余采用百分之一薄膜电阻。 5.仪表带有支架，方便使用。 6 尺寸： 83 （宽） X 152 （高） X34 ( 深） mm 。 7.重量：主机（不包含电池）约195克。 8.工作电流：9V电压时，稳定工作电流约20mA。 9.背光颜色可以绿色或白色，随机发货。 1.Features 1.1 Operates with ATmega328 microcontrollers. 1.2 Displaying the results to a 128x64 graphic LCD-Display. 1.3 One key operation with automatic power shutdown. 1.4 Shutdown current is only about 20nA. 1.5 Automatic detection of NPN and PNP bipolar transistors, N- and P-Channel MOSFETs, JFETs, diodes, double diodes, Thyristors and Triacs. 1.6 Automatic detection of pin layout of the detected part. 1.7 Measuring of current ampli?cation factor and Base-Emitter threshold voltage of bipolar transistors. 1.8 Darlington transistors can be identi?ed by the threshold voltage and high current ampli?cation factor. 1.9 Detection of the protection diode of bipolar transistors and MOSFETs. 1.10 Measuring of the Gate threshold voltage and Gate capacity value of MOSFETs. 1.11 Up to two Resistors are measured and shown with symbols and values with up to four decimal digits in the right dimension. All symbols are surrounded by the probe numbers of the Tester (1-3). So Potentiometer can also be measured. If the Potentiometer is adjusted to one of its ends, the Tester cannot di?er the middle pin and the end pin. 1.12 Resolution of resistor measurement is now up to 0.01?, values up to 50M? are detected. 1.13 One capacitor can be detected and measured. It is shown with symbol and value with up to four decimal digits in the right dimension. The value can be from 25pF to 100mF. The resolution can be up to 1pF . 1.14 For capacitors with a capacity value above 0.18μF the Equivalent Serial Resistance (ESR) is measured with a resolution of 0.01? and is shown with two signi?cant decimal digits. 1.15 For capacitors with a capacity value above 5000pF the voltage loss after a load pulse can be determined. The voltage loss give a hint for the quality factor of the capacitor. 1.16 Up to two diodes are shown with symbol or symbol in correct order. Additionally the ?ux voltages are shown. 1.17 LED is detected as diode, the ?ux voltage is much higher than normal. Two-in-one LEDs are also detected as two diodes. 1.18 Zener-Diodes can be detected, if reverse break down Voltage is below 4.5V. These are shown as two diodes, you can identify this part only by the voltages. The outer probe numbers, which surround the diode symbols, are identical in this case. You can identify the real Anode of the diode only by the one with break down (threshold) Voltage nearby 700mV! 1.19 If more than 3 diode type parts are detected, the number of founded diodes is shown additionally to the fail message. This can only happen, if Diodes are attached to all three probes and at least one is a Z-Diode. In this case you should only connect two probes and start measurement again, one after the other. 1.20 Measurement of the capacity value of a single diode in reverse direction. Bipolar Transistors can also be analysed, if you connect the Base and only one of Collector or Emitter. 1.21 Only one measurement is needed to ?nd out the connections of a bridge recti?er. 1.22 Capacitors with value below 25pF are usually not detectet, but can be measured together with a parallel diode or a parallel capacitor with at least 25pF. In this case you must subtract the capacity value of the parallel connected part. 1.23 For resistors below 2100? also the measurement of inductance will be done. The range will be from about 0.01mH to more than 20H, but the accuracy is not good. The measurement result is only shown with a single component connected. 1.24 Testing time is about two seconds, only capacity or inductance measurement can cause longer period. 1.25 Software can be con?gured to enable series of measurements before power will be shut down. 1.26 Selectable facility to calibrate the internal port resistance of port output and the zero o?set of capacity measurement with the selftest . A external capacitor with a value between 100nF and 20μF connected to pin 1 and pin 3 is necessary to compensate the o?set voltage of the analog comparator. This can reduce measurement errors of capacitors of up to 40μF. With the same capacitor a correction voltage to the internal reference voltage is found to adjust the gain for ADC measuring with the internal reference. 1.27 Display the Collector cuto? current ICE0 with currentless base (10μA units) and Collector residual current ICES with base hold to emitter level . This values are only shown, if they are not zero (especially for Germanium transistors). 1.28 Thyristors and Triacs can only be detected, if the test current is above the holding current. Some Thyristors and Triacs need as higher gate trigger current, than this Tester can deliver. The available testing current is only about 6mA! Attention: Allways be shure to discharge capacitors before connecting them to the Tester! The Tester may be damaged before you have switched it on. There is only a little protection at the ATmega ports. Extra causion is required if you try to test components mounted in a circuit. In either case the equipment should be disconnected from power source and you should be shure, that no residual voltage remains in the equipment.

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